Eclipsing Z-scan measurement of A/104 wave-front distortion
نویسندگان
چکیده
We introduce a simple modification to the Z-scan technique that results in a sensitivity enhancement that permits measurement of nonlinearly induced wave-front distortion -of A/10 . This sensitivity was achieved with 10-Hz repetition-rate pulsed laser sources. Sensitivity to nonlinear absorption is also enhanced by a factor of -3. This method permits characterization of nonlinear thin films without the need for waveguiding.
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